Electron Microscopes

HRTEM - JEM-2100F (JEOL)
Features:
The JEM-2100F is an advanced Field Emission Transmission Electron Microscope featuring ultrahigh resolution and rapid data acquisition. The JEM-2100F is a next generation TEM that simplifies atomic level structural analyses in biology, medicine, and materials sciences as well as the semiconductor and pharmaceutical industries.
The JEM-2100F has been developed to achieve the highest image quality and the highest analytical performance in the 200kV class analytical TEM with a probe size under 0.5 nm. The new side-entry goniometer stage provide ease of use tilt, rotation, heating and cooling, programmable multi-point settings--all without mechanical drift. The JEM-2100F at ODU-ARC is equipped with an Oxford Xplore SDD detector, a 11-megapixelGatan SC1000 ORIUS CCD camera, and a Gatan 626 single tilt liquid nitrogen cryo transfer holder.
Specifications:
Accelerating Voltage |
200 kV |
Electron Gun |
ZrO/W (100) field emission |
Imaging Mode |
High resolution Bright field Dark field STEM |
Resolution |
0.23 nm (point-to-point) 0.10 nm (lattice) 0.20 nm (STEM) |
Magnification |
MAG mode: 2,000x - 1,500,000x Low MAG mode: 50x - 6,000x SA MAG mode: 8,000x - 800,000x |
Spot Size |
2-5 nm (TEM mode) 0.5-2.4 nm (analytical mode) |
CCD Camera |
Gatan SC1000 ORIUS CCD camera (11 megapixel) |
EDS Unit: |
Oxford Xplore SDD detector |
EDS Modes |
Point analysis Line Scan Elemental mapping Spectral imaging |

SEM - JEOL JSM-6060LV
Features:
JEOL JSM-6060LV has resolution of 3.5 nm in the high vacuum SEM mode and 4.0nm in the lowvacuum SEM mode.
The newly developed electron optics has a lowest magnification of 5X.
The specimen chamber is tall enough for a 50mm high specimen and is equipped with a eucentricspecimen stage.
The operation graphic user interface (GUI) has automatic functions, recipe (customapplications settings), a simple Desk Top Publisher and a browseable image database forcomfortable operation from observation to report creation.
The low vacuum SEM mode enables one to observe and analyze non-conductive, wet, or high-vacuum incompatible specimens.
Specifications:
Accelerating Voltage |
5-30 kV |
Imaging Mode |
High vacuum (HV) for regular samples Low vacuum (LV) for biological samples |
Resolution |
3.5 nm (HV mode) 4.0 nm (LV mode) |
Magnification |
|
EDS Unit: |
Thermo Scientific UltraDry Premium EDS Detector |
EDS Modes |
Point & Shoot Line Scan Elemental mapping Spectral imaging |